Nonphotolithographic Nanoscale Memory Density Prospects

@article{lincoln-tnano05,
  title = {Nonphotolithographic Nanoscale Memory Density Prospects},
  abstract = {Technologies are now emerging to construct
     molecular-scale electronic wires and switches using bottom-up
     self-assembly. This opens the possibility of constructing
     nanoscale circuits and memories where active devices are just a
     few nanometers square and wire pitches may be on the order of ten
     nanometers. The features can be defined at this scale without
     using photolithography. The available assembly techniques have
     relatively high defect rates compared to conventional
     lithographic integrated circuits and can only produce very
     regular structures. Nonetheless, with proper memory organization,
     it is reasonable to expect these technologies to provide memory
     densities in excess of 10/sup 11/ b/cm/sup 2/ with modest active
     power requirements under 0.6 W/Tb/s for random read operations.},
  url = {http://www.cs.cmu.edu/~seth/papers/lincoln-tnano05.pdf},
  journal = {IEEE Transactions on Nanotechnology},
  author = {DeHon, Andre and Goldstein, Seth Copen and Kuekes, Phil
     and Lincoln, Patrick},
  year = {2005},
  month = {Mar},
  volume = {4},
  issue = {2},
  pages = {215-228},
  keywords = {Fault and Defect Tolerance, electronic nanotechnology,
     memory density, memory organization, molecular electronics},
  doi = {10.1109/TNANO.2004.837849},
}

@article{lincoln-tnano05,
  title = {Nonphotolithographic Nanoscale Memory Density Prospects},
  abstract = {Technologies are now emerging to construct
     molecular-scale electronic wires and switches using bottom-up
     self-assembly. This opens the possibility of constructing
     nanoscale circuits and memories where active devices are just a
     few nanometers square and wire pitches may be on the order of ten
     nanometers. The features can be defined at this scale without
     using photolithography. The available assembly techniques have
     relatively high defect rates compared to conventional
     lithographic integrated circuits and can only produce very
     regular structures. Nonetheless, with proper memory organization,
     it is reasonable to expect these technologies to provide memory
     densities in excess of 10/sup 11/ b/cm/sup 2/ with modest active
     power requirements under 0.6 W/Tb/s for random read operations.},
  url = {http://www.cs.cmu.edu/~seth/papers/lincoln-tnano05.pdf},
  journal = {IEEE Transactions on Nanotechnology},
  author = {DeHon, Andre and Goldstein, Seth Copen and Kuekes, Phil
     and Lincoln, Patrick},
  year = {2005},
  month = {Mar},
  volume = {4},
  issue = {2},
  pages = {215-228},
  keywords = {Fault and Defect Tolerance, electronic nanotechnology,
     memory density, memory organization, molecular electronics},
  doi = {10.1109/TNANO.2004.837849},
}

@inproceedings{goldstein-iccad05,
  title = {The impact of the nanoscale on computing systems},
  url = {http://www.cs.cmu.edu/~seth/papers/goldstein-iccad05.pdf},
  booktitle = {IEEE/ACM International Conference on Computer-Aided
     Design, 2005 (ICCAD 2005)},
  author = {Goldstein, Seth Copen},
  year = {2005},
  pages = {655-661},
  address = {San Jose, CA},
  month = {Nov},
  keywords = {Electronic Nanotechnology,molecular electronics},
}

@inproceedings{beckett-iscas05,
  title = {Why area might reduce power in nanoscale CMOS},
  url = {http://www.cs.cmu.edu/~seth/papers/beckett-iscas05.pdf},
  booktitle = {IEEE International Symposium on Circuits and Systems,
     2005, (ISCAS 2005)},
  author = {Beckett, Paul and Goldstein, Seth Copen},
  year = {2005},
  pages = {2329-2332},
  volume = {3},
  month = {May},
  address = {Kobe, Japan},
  abstract = {In this paper we explore the relationship between power
     and area. By exploiting parallelism (and thus using more area)
     one can reduce the switching frequency allowing a reduction in
     VDD which results in a reduction in power. Under a scaling regime
     which allows threshold voltage to increase as VDD decreases we
     find that dynamic and subthreshold power loss in CMOS exhibit a
     dependence on area proportional to A^((\sigma^-3)/\sigma) while
     gate leakage power proportional to A^((\sigma^-6)/\sigma) and
     short circuit power A^((\sigma^-6)/\sigma). Thus, with the large
     number of devices at our disposal we can exploit techniques such
     as spatial computing--tailoring the program directly to the
     hardware--to overcome the negative effects of scaling. The value
     of s describes the effectiveness of the technique for a
     particular circuit and/or algorithm--for circuits that exhibit a
     value of \sigma <= 3, power will be a constant or reducing
     function of area. We briefly speculate on how \sigma might be
     influenced by a move to nanoscale technology.},
  keywords = {Electronic Nanotechnology,Power,Energy},
}

@inproceedings{goldstein04-ersa04,
  author = {Goldstein, Seth Copen},
  title = {Computing Without Processors},
  booktitle = {International Conference on Engineering of
     Reconfigurable Systems and Algorithms (ERSA'04)},
  abstract = {The continuation of the remarkable exponential increases
     in processing power over the recent past faces imminent
     challenges due in part rising cost of design and manufacturing
     and the physics of deep-submicron semiconductor devices. In this
     talk we will discuss a promising alternative to ever more complex
     processors, application specific hardware (ASH). The ASH model is
     based on compiling high-level programs directly into circuits,
     which can either be fabricated as ASICs or more reasonably
     converted in configurations for reconfigurable devices. We will
     discuss the challenges involved in compiling sequential
     programming languages into circuits and the challenges in
     implementing those circuits in a scalable and power efficient
     manner.},
  address = {Las Vegas, NV},
  month = {Jun},
  year = {2004},
  pages = {29--32},
  keywords = {Reconfigurable Computing, Electronic Nanotechnology,
     Fault and Defect Tolerance},
}

@incollection{mishra-nqmc04,
  title = {Defect Tolerance at the End of the Roadmap},
  booktitle = {Nano, Quantum and Molecular Computing: Implications to
     High Level Design and Validation},
  author = {Mishra, Mahim and Goldstein, Seth Copen},
  year = {2004},
  editor = {Sandeep K. Shukla and R. Iris Bahar},
  publisher = {Kluwer Academic Publishers},
  isbn = {1-4020-80670},
  keywords = {Electronic Nanotechnology,Fault and Defect
     Tolerance,Reconfigurable Computing,Phoenix,molecular
     electronics},
}

@inproceedings{goldstein-gomac04,
  title = {The Challenges and Opportunities of Nanoelectronics},
  author = {Goldstein, Seth Copen},
  booktitle = {Proceedings of Government Microcircuit Applications and
     Critical Technology Conference (GOMAC Tech 04)},
  year = {2004},
  address = {Monterey, CA},
  keywords = {Electronic Nanotechnology},
  month = {Mar},
  url = {http://www.cs.cmu.edu/~seth/papers/goldstein-gomac04.pdf},
}

@inproceedings{budiu-async04,
  title = {Translating ANSI C to Asynchronous Circuits},
  url = {http://www.cs.cmu.edu/~seth/papers/budiu-async04.pdf},
  booktitle = {10th IEEE International Symposium on Asynchronous
     Circuits and Systems (ASYNC '04)},
  author = {Budiu, Mihai and Venkataramani, Girish and Chelcea,
     Tiberiu and Goldstein, Seth Copen},
  address = {Crete, Greece},
  year = {2004},
  month = {Apr},
  keywords = {Asychronous Circuits,CAD,Electronic Nanotechnology,Fault
     and Defect Tolerance,Phoenix,Reconfigurable Computing,Spatial
     Computing},
}

@inproceedings{goldstein-inano03,
  title = {Models and Abstractions for Nanoelectronics},
  booktitle = {Third IEEE Conference on Nanotechnology (IEEE-NANO
     2003)},
  author = {Goldstein, Seth Copen and Zhu, Y},
  address = {San Francisco, CA},
  year = {2003},
  month = {Aug},
  keywords = {Electronic Nanotechnology},
}

@article{mircea-ieee03,
  title = {Molecular Electronics: From Devices and Interconnect to
     Circuits and Architecture},
  author = {Stan, Mircea R and Franzon, Paul D and Goldstein, Seth
     Copen and Lach, John C and Ziegler, Matthew M},
  journal = {Proceedings of the IEEE},
  year = {2003},
  volume = {91},
  number = {11},
  month = {Nov},
  keywords = {Electronic Nanotechnology},
  url = {http://www.cs.cmu.edu/~seth/papers/mircea-ieee03.pdf},
}

@incollection{goldstein-mn03,
  title = {Molecules, Gates, Circuits, Computer},
  url = {http://www.cs.cmu.edu/~seth/papers/goldstein-mn03.pdf},
  booktitle = {Molecular Nanoelectronics},
  author = {Goldstein, Seth Copen and Budiu, Mihai},
  year = {2003},
  editor = {Mark A. Reed and Takhee Lee},
  publisher = {American Scientific Publishers},
  address = {Stevenson Ranch, CA},
  month = {Jan},
  isbn = {1-588883-006-3},
  keywords = {Asychronous Circuits,CAD,Electronic Nanotechnology,Fault
     and Defect Tolerance,Reconfigurable Computing,Spatial
     Computing,electronic nanotechnology,molecular electronics},
}

@inproceedings{shukla-hldvt03,
  title = {Nano, Quantum, and Molecular Computing: Are We Ready for
     the Validation and Test Challenges},
  url = {http://www.cs.cmu.edu/~seth/papers/shukla-hldvt03.pdf},
  talk = {http://www.cs.cmu.edu/~seth/hldvt03-goldstein.pdf},
  booktitle = {Eighth IEEE International High-Level Design Validation
     and Test Workshop},
  author = {Shukla, Sandeep K. and Karri, Ramesh and Goldstein, Seth
     Copen and Brewer, Forest and Banerjee, Kaustav and Basu, Sankar},
  year = {2003},
  month = {Nov},
  pages = {307},
  address = {San Francisco, CA},
  keywords = {Electronic Nanotechnology,Fault and Defect
     Tolerance,molecular electronics},
}

@inproceedings{goldstein-asap03,
  title = {Reconfigurable Computing and Electronic Nanotechnology},
  author = {Goldstein, Seth Copen and Budiu, Mihai and Mishra, Mahim
     and Venkataramani, Girish},
  booktitle = {Proceedings of the {IEEE} 14th International Conference
     on Application-specific Systems, Architectures and Processors
     ({ASAP} 2003)},
  year = {2003},
  address = {The Hague, Netherlands},
  month = {Jun},
  note = {Invited paper},
  pages = {132-143},
  abstract = {In this paper we examine the opportunities brought about
     by recent progress in electronic nanotechnology and describe the
     methods needed to harness them for building a new computer
     architecture. In this process we decompose some traditional
     abstractions, such as the transistor, into fine-grain pieces,
     such as signal restoration and input-output isolation. We also
     show how we can forgo the extreme reliability of CMOS circuits
     for low-cost chemical self-assembly at the expense of large
     manufacturing defect densities. We discuss advanced testing
     methods which can be used to recover perfect functionality from
     unreliable parts. We proceed to show how the molecular switch,
     the regularity of the circuits created by self-assembly and the
     high defect densities logically require the use of reconfigurable
     hardware as a basic building block for hardware design. We then
     capitalize on the convergence of compilation and hardware
     synthesis (which takes place when programming reconfigurable
     hardware) to propose the complete elimination of the
     instruction-set architecture from the system architecture, and
     the synthesis of asynchronous dataflow machines directly from
     high-level programming languages, such as C. We discuss in some
     detail a scalable compilation system that perform this task.},
  keywords = {Reconfigurable Computing, Electronic Nanotechnology},
  url = {http://www.cs.cmu.edu/~seth/papers/goldstein-asap03.pdf},
}

@inproceedings{goldstein-hldvt03,
  title = {Reconfigurable Nanoelectronics and Defect Tolerance},
  author = {Goldstein, Seth Copen},
  booktitle = {Proceedings of High-level design, verification, and
     test},
  year = {2003},
  keywords = {Reconfigurable Computing, Electronic Nanotechnology,
     Fault and Defect Tolerance},
}

@inproceedings{isscc02,
  author = {Rosewater, Dan and Goldstein, Seth Copen},
  title = {Digital Logic Using Molecular Electronics},
  booktitle = {IEEE International Solid-State Circuits Conference
     (ISSCC)},
  year = {2002},
  month = {Feb},
  address = {San Francisco, CA},
  keywords = {Electronic Nanotechnology,Molecular
     Electronics,Two-Terminal Devices},
  url = {http://www.cs.cmu.edu/~seth/papers/isscc02.pdf},
}

@inproceedings{micro02,
  title = {From Molecules to Computers},
  author = {Goldstein, Seth Copen},
  year = {2002},
  address = {Istanbul, Turkey},
  booktitle = {Tutorial at 35th Annual International Symposium on
     Microarchitecture (Micro 35)},
  note = {Invited Tutorial},
  url = {http://www.cs.cmu.edu/~seth/papers/micro02.pdf},
  month = {Nov},
  keywords = {Electronic Nanotechnology},
}

@inproceedings{butts-iccad02,
  title = {Molecular electronics: devices, systems and tools for
     gigagate,gigabit chips},
  url = {http://www.cs.cmu.edu/~seth/papers/butts-iccad02.pdf},
  doi = {http://doi.ieeecomputersociety.org/10.1109/ICCAD.2002.1167569},
  booktitle = {International Conference on Computer-Aided Design (
     ICCAD '02)},
  author = {Butts, Michael and DeHon, Andre and Goldstein, Seth
     Copen},
  abstract = {New electronics technologies are emerging which may
     carry us beyond the limits of lithographic processing down to
     molecular-scale feature sizes. Devices and interconnects can be
     made from a variety of molecules and materials including bistable
     and switchable organic molecules, carbon nanotubes, and,
     single-crystal semiconductor nanowires. They can be
     self-assembled into organized structures and attached onto
     lithographic substrates. This tutorial reviews emerging
     molecular-scale electronics technology for CAD and system
     designers and highlights where ICCAD research can help support
     this technology.},
  address = {San Jose, CA},
  year = {2002},
  pages = {433-440},
  note = {invited tutorial at},
  month = {Nov},
  keywords = {Electronic Nanotechnology,Reconfigurable
     Computing,molecular electronics},
}

@techreport{rg01,
  author = {Rosewater, Daniel L. and Goldstein, Seth Copen},
  title = {What makes a good molecular computing device?},
  institution = {Carnegie Mellon University},
  year = {2002},
  number = {CMU-CS-02-181},
  month = {Sep},
  keywords = {Electronic Nanotechnology},
  url = {http://www.cs.cmu.edu/~seth/papers/rg01.pdf},
}

@inproceedings{goldstein-wvlsi01,
  title = {Electronic Nanotechnology and Reconfigurable Computing},
  url = {http://www.cs.cmu.edu/~seth/papers/goldstein-wvlsi01.pdf},
  booktitle = {Proceedings of the IEEE Computer Society Workshop VLSI
     2001},
  author = {Goldstein, Seth Copen},
  year = {2001},
  pages = {10},
  month = {Apr},
  keywords = {Electronic Nanotechnology,Fault and Defect
     Tolerance,Reconfigurable Computing},
}

@inproceedings{goldstein-foresight01,
  author = {Goldstein, Seth Copen and Ellenbogen, James and Almassiam,
     David and Brown, Matt and Cannarsa, Mark and Klein, Jesse and
     Schell, Schuyler and Washburn, Geoff and Ziegler, Matthew M},
  title = {MolSpice: Designing Molecular Logic Circuits},
  booktitle = {Ninth Foresight Conference on Molecular
     Nanotechnology},
  url = {http://www.cs.cmu.edu/~seth/papers/goldstein-foresight01.pdf},
  year = {2001},
  month = {Nov},
  address = {Santa Clara, CA},
  keywords = {Electronic Nanotechnology, Molecular Electronics, CAD},
}

@inproceedings{goldstein-isca01,
  author = {Goldstein, Seth Copen and Budiu, Mihai},
  title = {{NanoFabrics}: Spatial Computing Using Molecular
     Electronics},
  booktitle = {Proceedings of the 28th International Symposium on
     Computer Architecture (ISCA)},
  month = {Jul},
  address = {{G\"{o}teborg, Sweden}},
  year = {2001},
  pages = {178--189},
  abstract = {The continuation of the remarkable exponential increases
     in processing power over the recent past faces imminent
     challenges due in part to the physics of deep-submicron CMOS
     devices and the costs of both chip masks and future fabrication
     plants. A promising solution to these problems is offered by an
     alternative to CMOS-based computing, chemically assembled
     electronic nanotechnology (CAEN). In this paper we outline how
     CAEN based computing can become a reality. We briefly describe
     recent work in CAEN and how CAEN will affect computer
     architecture. We show how the inherently reconfigurable natures
     of CAEN devices can be exploited to provide high-density chips
     with defect tolerance which will significantly reduce the cost of
     manufacturing. After developing the basic building blocks of a
     CAEN based computing devices we present some preliminary results
     which indicate that CAEN based computing devices can meet or
     exceed the performance of CMOS based devices.},
  url = {http://www.cs.cmu.edu/~seth/papers/goldstein-isca01.pdf},
  keywords = {Spatial Computing, Reconfigurable Computing,Phoenix,
     Electronic Nanotechnology},
}

@inproceedings{goldstein-asplos00,
  title = {NanoFabrics: Extending Moore's Law Beyond the CMOS Era},
  url = {http://www.cs.cmu.edu/~seth/papers/goldstein-asplos00.pdf},
  booktitle = {The 10th International Conference on Architectural
     Support for Programming Languages and Operating Systems. (ASPLOS
     'IX)},
  author = {Goldstein, Seth Copen},
  address = {Cambridge, MA},
  year = {2000},
  month = {Nov},
  keywords = {Electronic Nanotechnology,Fault and Defect
     Tolerance,Molecular Electronics,Reconfigurable Computing},
}

@article{lincoln-tnano05,
  title = {Nonphotolithographic Nanoscale Memory Density Prospects},
  abstract = {Technologies are now emerging to construct
     molecular-scale electronic wires and switches using bottom-up
     self-assembly. This opens the possibility of constructing
     nanoscale circuits and memories where active devices are just a
     few nanometers square and wire pitches may be on the order of ten
     nanometers. The features can be defined at this scale without
     using photolithography. The available assembly techniques have
     relatively high defect rates compared to conventional
     lithographic integrated circuits and can only produce very
     regular structures. Nonetheless, with proper memory organization,
     it is reasonable to expect these technologies to provide memory
     densities in excess of 10/sup 11/ b/cm/sup 2/ with modest active
     power requirements under 0.6 W/Tb/s for random read operations.},
  url = {http://www.cs.cmu.edu/~seth/papers/lincoln-tnano05.pdf},
  journal = {IEEE Transactions on Nanotechnology},
  author = {DeHon, Andre and Goldstein, Seth Copen and Kuekes, Phil
     and Lincoln, Patrick},
  year = {2005},
  month = {Mar},
  volume = {4},
  issue = {2},
  pages = {215-228},
  keywords = {Fault and Defect Tolerance, electronic nanotechnology,
     memory density, memory organization, molecular electronics},
  doi = {10.1109/TNANO.2004.837849},
}

@inproceedings{goldstein04-ersa04,
  author = {Goldstein, Seth Copen},
  title = {Computing Without Processors},
  booktitle = {International Conference on Engineering of
     Reconfigurable Systems and Algorithms (ERSA'04)},
  abstract = {The continuation of the remarkable exponential increases
     in processing power over the recent past faces imminent
     challenges due in part rising cost of design and manufacturing
     and the physics of deep-submicron semiconductor devices. In this
     talk we will discuss a promising alternative to ever more complex
     processors, application specific hardware (ASH). The ASH model is
     based on compiling high-level programs directly into circuits,
     which can either be fabricated as ASICs or more reasonably
     converted in configurations for reconfigurable devices. We will
     discuss the challenges involved in compiling sequential
     programming languages into circuits and the challenges in
     implementing those circuits in a scalable and power efficient
     manner.},
  address = {Las Vegas, NV},
  month = {Jun},
  year = {2004},
  pages = {29--32},
  keywords = {Reconfigurable Computing, Electronic Nanotechnology,
     Fault and Defect Tolerance},
}

@incollection{mishra-nqmc04,
  title = {Defect Tolerance at the End of the Roadmap},
  booktitle = {Nano, Quantum and Molecular Computing: Implications to
     High Level Design and Validation},
  author = {Mishra, Mahim and Goldstein, Seth Copen},
  year = {2004},
  editor = {Sandeep K. Shukla and R. Iris Bahar},
  publisher = {Kluwer Academic Publishers},
  isbn = {1-4020-80670},
  keywords = {Electronic Nanotechnology,Fault and Defect
     Tolerance,Reconfigurable Computing,Phoenix,molecular
     electronics},
}

@inproceedings{budiu-async04,
  title = {Translating ANSI C to Asynchronous Circuits},
  url = {http://www.cs.cmu.edu/~seth/papers/budiu-async04.pdf},
  booktitle = {10th IEEE International Symposium on Asynchronous
     Circuits and Systems (ASYNC '04)},
  author = {Budiu, Mihai and Venkataramani, Girish and Chelcea,
     Tiberiu and Goldstein, Seth Copen},
  address = {Crete, Greece},
  year = {2004},
  month = {Apr},
  keywords = {Asychronous Circuits,CAD,Electronic Nanotechnology,Fault
     and Defect Tolerance,Phoenix,Reconfigurable Computing,Spatial
     Computing},
}

@inproceedings{mishra-itsw03,
  author = {Mishra, Mahim and Goldstein, Seth Copen},
  title = {Defect Tolerance After the Roadmap},
  booktitle = {Proceedings of the 10th International Test Synthesis
     Workshop (ITSW)},
  month = {Mar},
  year = {2003},
  address = {Santa Barbara, {CA}},
  keywords = {Spatial Computing, Reconfigurable Computing,Phoenix,
     Fault and Defect Tolerance},
  url = {http://www.cs.cmu.edu/~seth/papers/mishra-itsw03.pdf},
}

@inproceedings{mishra-itc03,
  author = {Mishra, Mahim and Goldstein, Seth Copen},
  title = {Defect Tolerance at the End of the Roadmap},
  booktitle = {Proceedings of the International Test Conference
     ({ITC}), 2003},
  month = {Sep},
  year = {2003},
  address = {Charlotte, {NC}},
  url = {http://www.cs.cmu.edu/~seth/papers/mishra-itc03.pdf},
  abstract = {Defect tolerance will become more important as feature
     sizes shrink closer to single digit nanometer dimensions. This is
     true whether the chips are manufactured using top-down methods
     (e.g., photolithography) or bottom-up methods (e.g., chemically
     assembled electronic nanotechnology, or CAEN). In this paper, we
     propose a defect tolerance methodology centered around
     reconfigurable devices, a scalable testing method, and dynamic
     place-and-route. Our methodology is particularly well suited for
     CAEN.},
  keywords = {Spatial Computing, Reconfigurable
     Computing,Phoenix,Fault and Defect Tolerance},
}

@incollection{goldstein-mn03,
  title = {Molecules, Gates, Circuits, Computer},
  url = {http://www.cs.cmu.edu/~seth/papers/goldstein-mn03.pdf},
  booktitle = {Molecular Nanoelectronics},
  author = {Goldstein, Seth Copen and Budiu, Mihai},
  year = {2003},
  editor = {Mark A. Reed and Takhee Lee},
  publisher = {American Scientific Publishers},
  address = {Stevenson Ranch, CA},
  month = {Jan},
  isbn = {1-588883-006-3},
  keywords = {Asychronous Circuits,CAD,Electronic Nanotechnology,Fault
     and Defect Tolerance,Reconfigurable Computing,Spatial
     Computing,electronic nanotechnology,molecular electronics},
}

@inproceedings{shukla-hldvt03,
  title = {Nano, Quantum, and Molecular Computing: Are We Ready for
     the Validation and Test Challenges},
  url = {http://www.cs.cmu.edu/~seth/papers/shukla-hldvt03.pdf},
  talk = {http://www.cs.cmu.edu/~seth/hldvt03-goldstein.pdf},
  booktitle = {Eighth IEEE International High-Level Design Validation
     and Test Workshop},
  author = {Shukla, Sandeep K. and Karri, Ramesh and Goldstein, Seth
     Copen and Brewer, Forest and Banerjee, Kaustav and Basu, Sankar},
  year = {2003},
  month = {Nov},
  pages = {307},
  address = {San Francisco, CA},
  keywords = {Electronic Nanotechnology,Fault and Defect
     Tolerance,molecular electronics},
}

@inproceedings{goldstein-hldvt03,
  title = {Reconfigurable Nanoelectronics and Defect Tolerance},
  author = {Goldstein, Seth Copen},
  booktitle = {Proceedings of High-level design, verification, and
     test},
  year = {2003},
  keywords = {Reconfigurable Computing, Electronic Nanotechnology,
     Fault and Defect Tolerance},
}

@inproceedings{mishra_goldstein_nsc1,
  author = {Mishra, Mahim and Goldstein, Seth Copen},
  title = {Scalable Defect Tolerance for Molecular Electronics},
  booktitle = {Proceedings of the 1st Workshop on Non-Silicon
     Computing (NSC-1)},
  address = {{Cambridge, MA}},
  year = {2002},
  url = {http://www.cs.cmu.edu/~seth/papers/mishra_goldstein_nsc1.pdf},
  abstract = {Chemically assembled electronic nanotechnology (CAEN) is
     a promising alternative to CMOS-based computing. However,
     CAEN-based circuits are expected to have huge defect densities.
     To solve this problem CAEN can be used to build reconfigurable
     fabrics which, assuming the defects can be found, are inherently
     defect tolerant. In this paper, we propose a scalable testing
     methodology for finding defects in reconfigurable devices.},
  keywords = {Reconfigurable Computing, Phoenix,Fault and Defect
     Tolerance},
}

@inproceedings{goldstein-wvlsi01,
  title = {Electronic Nanotechnology and Reconfigurable Computing},
  url = {http://www.cs.cmu.edu/~seth/papers/goldstein-wvlsi01.pdf},
  booktitle = {Proceedings of the IEEE Computer Society Workshop VLSI
     2001},
  author = {Goldstein, Seth Copen},
  year = {2001},
  pages = {10},
  month = {Apr},
  keywords = {Electronic Nanotechnology,Fault and Defect
     Tolerance,Reconfigurable Computing},
}

@inproceedings{KSS00,
  author = {Kamarchik, Peter M. and Sinha, Steven and Goldstein, Seth
     Copen},
  title = {Fault Tolerance in Run-time Reconfigurable Architectures},
  booktitle = {IEEE Symposium on FPGAs for Custom Computing Machines
     (FCCM '00)},
  year = {2000},
  month = {Apr},
  address = {Napa, CA},
  keywords = {PipeRench, Fault and Defect Tolerance},
}

@inproceedings{goldstein-asplos00,
  title = {NanoFabrics: Extending Moore's Law Beyond the CMOS Era},
  url = {http://www.cs.cmu.edu/~seth/papers/goldstein-asplos00.pdf},
  booktitle = {The 10th International Conference on Architectural
     Support for Programming Languages and Operating Systems. (ASPLOS
     'IX)},
  author = {Goldstein, Seth Copen},
  address = {Cambridge, MA},
  year = {2000},
  month = {Nov},
  keywords = {Electronic Nanotechnology,Fault and Defect
     Tolerance,Molecular Electronics,Reconfigurable Computing},
}

@inproceedings{sinha-fccm00,
  title = {Tunable Fault Tolerance for Runtime Reconfigurable
     Architectures},
  url = {http://www.cs.cmu.edu/~seth/papers/sinha-fccm00.pdf},
  booktitle = {8th IEEE Symposium on Field-Programmable Custom
     Computing Machines (FCCM 2000)},
  author = {Sinha, Steven K. and Kamarchik, Peter M. and Goldstein,
     Seth Copen},
  abstract = {Fault tolerance is becoming an increasingly important
     issue, especially in mission-critical applications where data
     integrity is a paramount concern. Performance, however, remains a
     large driving force in the market place. Runtime reconfigurable
     hardware architectures have the power to balance fault tolerance
     with performance, allowing the amount of fault tolerance to be
     tuned at run-time. This paper describes a new built-in self-test
     designed to run on, and take advantage of, runtime reconfigurable
     architectures using the PipeRench architecture as a model. In
     addition, this paper introduces a new metric by which a user can
     set the desired fault tolerance of a runtime reconfigurable
     device},
  doi = {10.1109/FPGA.2000.903405},
  year = {2000},
  pages = {185-192},
  isbn = {0-7695-0871-5},
  address = {Napa Valley, CA},
  month = {Apr},
  keywords = {Fault And Defect Tolerance,PipeRench,Reconfigurable
     Computing},
}

@inproceedings{blanton-ftc98,
  author = {Blanton, Shawn and Goldstein, Seth Copen and Schmit,
     Herman},
  title = {Tunable Fault Tolernace via Test and Reconfiguration},
  booktitle = {Digest of FastAbstracts of the 28th Annual
     International Symposium on Fault-Tolerant Computing},
  year = {1998},
  month = {Jun},
  pages = {9--10},
  keywords = {PipeRench, Fault and Defect Tolerance},
  url = {http://www.cs.cmu.edu/~seth/papers/blanton-ftc98.pdf},
}

@article{lincoln-tnano05,
  title = {Nonphotolithographic Nanoscale Memory Density Prospects},
  abstract = {Technologies are now emerging to construct
     molecular-scale electronic wires and switches using bottom-up
     self-assembly. This opens the possibility of constructing
     nanoscale circuits and memories where active devices are just a
     few nanometers square and wire pitches may be on the order of ten
     nanometers. The features can be defined at this scale without
     using photolithography. The available assembly techniques have
     relatively high defect rates compared to conventional
     lithographic integrated circuits and can only produce very
     regular structures. Nonetheless, with proper memory organization,
     it is reasonable to expect these technologies to provide memory
     densities in excess of 10/sup 11/ b/cm/sup 2/ with modest active
     power requirements under 0.6 W/Tb/s for random read operations.},
  url = {http://www.cs.cmu.edu/~seth/papers/lincoln-tnano05.pdf},
  journal = {IEEE Transactions on Nanotechnology},
  author = {DeHon, Andre and Goldstein, Seth Copen and Kuekes, Phil
     and Lincoln, Patrick},
  year = {2005},
  month = {Mar},
  volume = {4},
  issue = {2},
  pages = {215-228},
  keywords = {Fault and Defect Tolerance, electronic nanotechnology,
     memory density, memory organization, molecular electronics},
  doi = {10.1109/TNANO.2004.837849},
}

@inproceedings{goldstein-iccad05,
  title = {The impact of the nanoscale on computing systems},
  url = {http://www.cs.cmu.edu/~seth/papers/goldstein-iccad05.pdf},
  booktitle = {IEEE/ACM International Conference on Computer-Aided
     Design, 2005 (ICCAD 2005)},
  author = {Goldstein, Seth Copen},
  year = {2005},
  pages = {655-661},
  address = {San Jose, CA},
  month = {Nov},
  keywords = {Electronic Nanotechnology,molecular electronics},
}

@incollection{mishra-nqmc04,
  title = {Defect Tolerance at the End of the Roadmap},
  booktitle = {Nano, Quantum and Molecular Computing: Implications to
     High Level Design and Validation},
  author = {Mishra, Mahim and Goldstein, Seth Copen},
  year = {2004},
  editor = {Sandeep K. Shukla and R. Iris Bahar},
  publisher = {Kluwer Academic Publishers},
  isbn = {1-4020-80670},
  keywords = {Electronic Nanotechnology,Fault and Defect
     Tolerance,Reconfigurable Computing,Phoenix,molecular
     electronics},
}

@misc{patent06,
  author = {Goldstein, Seth Copen and Rosewater, Daniel L.},
  title = {Methods of chemically assembled electronic nanotechnology
     circuit fabrication},
  howpublished = {United States Patent No. 7,064,000. Issued June 20,
     2006},
  month = {Jul},
  year = {2004},
  url = {http://www.cs.cmu.edu/~seth/papers/patent06.pdf},
  keywords = {Molecular Electronics,Two-Terminal Devices},
  abstract = {Chemically assembled electronic nanotechnology (CAEN)
     provides an alternative to using Complementary Metal Oxide
     Semiconductor (CMOS) for constructing circuits with feature sizes
     in the tens of nanometers. A molecular latch and a method using
     the latch that enables it to act as a state holding device,
     perform voltage restoration, and to provide I/O isolation is
     disclosed.},
  url = {http://www.cs.cmu.edu/~seth/papers/patent06.pdf},
}

@incollection{goldstein-mn03,
  title = {Molecules, Gates, Circuits, Computer},
  url = {http://www.cs.cmu.edu/~seth/papers/goldstein-mn03.pdf},
  booktitle = {Molecular Nanoelectronics},
  author = {Goldstein, Seth Copen and Budiu, Mihai},
  year = {2003},
  editor = {Mark A. Reed and Takhee Lee},
  publisher = {American Scientific Publishers},
  address = {Stevenson Ranch, CA},
  month = {Jan},
  isbn = {1-588883-006-3},
  keywords = {Asychronous Circuits,CAD,Electronic Nanotechnology,Fault
     and Defect Tolerance,Reconfigurable Computing,Spatial
     Computing,electronic nanotechnology,molecular electronics},
}

@inproceedings{shukla-hldvt03,
  title = {Nano, Quantum, and Molecular Computing: Are We Ready for
     the Validation and Test Challenges},
  url = {http://www.cs.cmu.edu/~seth/papers/shukla-hldvt03.pdf},
  talk = {http://www.cs.cmu.edu/~seth/hldvt03-goldstein.pdf},
  booktitle = {Eighth IEEE International High-Level Design Validation
     and Test Workshop},
  author = {Shukla, Sandeep K. and Karri, Ramesh and Goldstein, Seth
     Copen and Brewer, Forest and Banerjee, Kaustav and Basu, Sankar},
  year = {2003},
  month = {Nov},
  pages = {307},
  address = {San Francisco, CA},
  keywords = {Electronic Nanotechnology,Fault and Defect
     Tolerance,molecular electronics},
}

@inproceedings{isscc02,
  author = {Rosewater, Dan and Goldstein, Seth Copen},
  title = {Digital Logic Using Molecular Electronics},
  booktitle = {IEEE International Solid-State Circuits Conference
     (ISSCC)},
  year = {2002},
  month = {Feb},
  address = {San Francisco, CA},
  keywords = {Electronic Nanotechnology,Molecular
     Electronics,Two-Terminal Devices},
  url = {http://www.cs.cmu.edu/~seth/papers/isscc02.pdf},
}

@inproceedings{butts-iccad02,
  title = {Molecular electronics: devices, systems and tools for
     gigagate,gigabit chips},
  url = {http://www.cs.cmu.edu/~seth/papers/butts-iccad02.pdf},
  doi = {http://doi.ieeecomputersociety.org/10.1109/ICCAD.2002.1167569},
  booktitle = {International Conference on Computer-Aided Design (
     ICCAD '02)},
  author = {Butts, Michael and DeHon, Andre and Goldstein, Seth
     Copen},
  abstract = {New electronics technologies are emerging which may
     carry us beyond the limits of lithographic processing down to
     molecular-scale feature sizes. Devices and interconnects can be
     made from a variety of molecules and materials including bistable
     and switchable organic molecules, carbon nanotubes, and,
     single-crystal semiconductor nanowires. They can be
     self-assembled into organized structures and attached onto
     lithographic substrates. This tutorial reviews emerging
     molecular-scale electronics technology for CAD and system
     designers and highlights where ICCAD research can help support
     this technology.},
  address = {San Jose, CA},
  year = {2002},
  pages = {433-440},
  note = {invited tutorial at},
  month = {Nov},
  keywords = {Electronic Nanotechnology,Reconfigurable
     Computing,molecular electronics},
}

@misc{patent04,
  author = {Goldstein, Seth Copen and Rosewater, Daniel L.},
  title = {Molecular scale latch and associated clocking scheme to
     provide gain, memory and I/O isolation},
  howpublished = {United States Patent No. 6,777,982. Issued August
     17, 2004},
  month = {Apr},
  url = {http://www.cs.cmu.edu/~seth/papers/patent04.pdf},
  year = {2002},
  keywords = {Molecular Electronics,Two-Terminal Devices},
  abstract = {Chemically assembled electronic nanotechnology (CAEN)
     provides an alternative to using Complementary Metal Oxide
     Semiconductor (CMOS) for constructing circuits with feature sizes
     in the tens of nanometers. A molecular latch and a method using
     the latch that enables it to act as a state holding device,
     perform voltage restoration, and to provide I/O isolation is
     disclosed.},
  url = {http://www.cs.cmu.edu/~seth/papers/patent04.pdf},
}

@inproceedings{goldstein-foresight01,
  author = {Goldstein, Seth Copen and Ellenbogen, James and Almassiam,
     David and Brown, Matt and Cannarsa, Mark and Klein, Jesse and
     Schell, Schuyler and Washburn, Geoff and Ziegler, Matthew M},
  title = {MolSpice: Designing Molecular Logic Circuits},
  booktitle = {Ninth Foresight Conference on Molecular
     Nanotechnology},
  url = {http://www.cs.cmu.edu/~seth/papers/goldstein-foresight01.pdf},
  year = {2001},
  month = {Nov},
  address = {Santa Clara, CA},
  keywords = {Electronic Nanotechnology, Molecular Electronics, CAD},
}

@inproceedings{goldstein-asplos00,
  title = {NanoFabrics: Extending Moore's Law Beyond the CMOS Era},
  url = {http://www.cs.cmu.edu/~seth/papers/goldstein-asplos00.pdf},
  booktitle = {The 10th International Conference on Architectural
     Support for Programming Languages and Operating Systems. (ASPLOS
     'IX)},
  author = {Goldstein, Seth Copen},
  address = {Cambridge, MA},
  year = {2000},
  month = {Nov},
  keywords = {Electronic Nanotechnology,Fault and Defect
     Tolerance,Molecular Electronics,Reconfigurable Computing},
}

@article{lincoln-tnano05,
  title = {Nonphotolithographic Nanoscale Memory Density Prospects},
  abstract = {Technologies are now emerging to construct
     molecular-scale electronic wires and switches using bottom-up
     self-assembly. This opens the possibility of constructing
     nanoscale circuits and memories where active devices are just a
     few nanometers square and wire pitches may be on the order of ten
     nanometers. The features can be defined at this scale without
     using photolithography. The available assembly techniques have
     relatively high defect rates compared to conventional
     lithographic integrated circuits and can only produce very
     regular structures. Nonetheless, with proper memory organization,
     it is reasonable to expect these technologies to provide memory
     densities in excess of 10/sup 11/ b/cm/sup 2/ with modest active
     power requirements under 0.6 W/Tb/s for random read operations.},
  url = {http://www.cs.cmu.edu/~seth/papers/lincoln-tnano05.pdf},
  journal = {IEEE Transactions on Nanotechnology},
  author = {DeHon, Andre and Goldstein, Seth Copen and Kuekes, Phil
     and Lincoln, Patrick},
  year = {2005},
  month = {Mar},
  volume = {4},
  issue = {2},
  pages = {215-228},
  keywords = {Fault and Defect Tolerance, electronic nanotechnology,
     memory density, memory organization, molecular electronics},
  doi = {10.1109/TNANO.2004.837849},
}